Sharp EL-6490 Uživatelský manuál

JSM-6490LA/JSM-6490A/JSM-6490LV/JSM-6490Serving Advanced TechnologyScanning Electron Microscopes

10It is important to use the optimum probe current for each application such as surface obser-vation or elemental analysis. The probe current is adjus

11Report CreationYou can specify a directory and a file name to automaticallysave acquired images with JSM-6490 series SEMs. A fourdigit sequential nu

12Stereo images (Copper oxide) 20kV 6,000Principle of eucentric specimen stageEucentric rotationX-Y shift

13Efficient Specimen Survey by Motor Control A click and hold on the shift icon moves the specimen continu-ously. Tilting the joy stick on the optiona

A small amount of air is introduced into the specimen chamber.These air molecules, oxygen and nitrogen, are ionized with the inci-dent electrons. Thes

15Freeze Dry in the LV SEMObservation of hydrated specimensPre-treatment of specimens Many specimens can be observedwithout any pre-treatment. The

16You can analyze crystal orientation on sub-micron areas with anoptional Electron Back Scatter Diffraction (EBSD) detector. JSM-6490 series SEM provi

17The Analysis Station is the new analysis system developed on theconcept of “seamless from observation to analysis”. The results ofanalyses are alway

18The electron optics column is designed to maintain high vacuumduring operation so that frequency of maintenance is kept low.The objective lens apert

19JSM-6490 Scaning Elecron MicroscopeInstallation Layout (JSM-6490LV)Backscattered electron detector*1Low vacuum secondary electron detectorEnergy

2Large Specimen Handled EasilyEase of operation basedon high quality opticsGUI for “Intuitive Operation” Multi disciplinary large specimen chamber and

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3JEOL has improved the electron optics based on a beliefthat high performance optics makes its operation easier.The new super conical objective lens g

4Observation Started QuicklyOperation Steps with Smile ShotSet a specimen on thespecimen stage.Select a kind and con-dition of specimen.Click OK bu

5ABCEFDEasy to Understand Operation MenuThe GUI has been developed for easy, intu-itive operation. The default operation GUIdisplays the most often us

6Secondary electrons are suitable for observation of surface structures.Backscattered electrons, which are generated simultaneously with sec-ondary el

7Multi Live Image DisplayTwo kinds of live images are displayed side-by-side or top and bottom on the main image display area. The contrastand brightn

8The gun bias adjusts the brightness of the electron gun. The seamlessauto-bias by JEOL sets the optimum brightness over the entire range ofthe accele

9High Brightness LaB6 Gun (Optional)The LaB6 gun is easy to operate. Simply select the LaB6 on theGun alignment window. The LaB6 filament is factory p